Publication

Nuclear Reaction Analysis of Materials using MeV Ion Beams

Bibliographic Details
Summary:	This article is about computer simulation for surface analysis through nuclear techniques, which are non-destructive. The energy analysis method is used. Energy spectra are computer simulated and compared to experimental data, giving sample composition and concentration profiles. The method is successfully applied to depth profiling of light nuclei e. g. 12C and 18O in thick targets, using deuteron and proton induced reactions, respectively. Scanning electron microscopy is used as a complementary technique, to give information about surface topography.
Main Authors:	Carvalho, José Pacheco de
Other Authors:	Pacheco, Cláudia Ribeiro; Reis, Antonio
Subject:	Surface Analysis Computer Simulation Nuclear techniques Nuclear reactions Depth profiling
Year:	2017
Country:	Portugal
Document type:	conference output
Access type:	open access
Associated institution:	Universidade da Beira Interior
Language:	English
Origin:	uBibliorum

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