Publicação
Nuclear Reaction Analysis of Materials using MeV Ion Beams
| Resumo: | This article is about computer simulation for surface analysis through nuclear techniques, which are non-destructive. The energy analysis method is used. Energy spectra are computer simulated and compared to experimental data, giving sample composition and concentration profiles. The method is successfully applied to depth profiling of light nuclei e. g. 12C and 18O in thick targets, using deuteron and proton induced reactions, respectively. Scanning electron microscopy is used as a complementary technique, to give information about surface topography. |
|---|---|
| Autores principais: | Carvalho, José Pacheco de |
| Outros Autores: | Pacheco, Cláudia Ribeiro; Reis, Antonio |
| Assunto: | Surface Analysis Computer Simulation Nuclear techniques Nuclear reactions Depth profiling |
| Ano: | 2017 |
| País: | Portugal |
| Tipo de documento: | documento de conferência |
| Tipo de acesso: | acesso aberto |
| Instituição associada: | Universidade da Beira Interior |
| Idioma: | inglês |
| Origem: | uBibliorum |
| Resumo: | This article is about computer simulation for surface analysis through nuclear techniques, which are non-destructive. The energy analysis method is used. Energy spectra are computer simulated and compared to experimental data, giving sample composition and concentration profiles. The method is successfully applied to depth profiling of light nuclei e. g. 12C and 18O in thick targets, using deuteron and proton induced reactions, respectively. Scanning electron microscopy is used as a complementary technique, to give information about surface topography. |
|---|