Publicação
Thin film refractive index and thickness
| Resumo: | Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized in the development of integrated circuitry, are applied to both optical circuits and devices. This provides systems that show improved characteristics when compared to their electronic counterparts. Optical systems enable wider bandwidth operation, less power consumption, more immunity to interference and higher cost-efficiency. These features definitely represent a huge improvement in our daily lives when completely embedded in Information and Communications Technologies, replacing a large percentage of contemporaneous electronic based systems. The building blocks of these optical systems consist on waveguides and structures formed by deposited thin films. Two characteristics of utmost importance for these structures are the height and refractive index of the deposited film. In this work and by using a prism coupler, we will be presenting an optical setup and the experimental method that is used to determine both refractive index and thickness of the wave guiding structure. |
|---|---|
| Autores principais: | Lourenço, Paulo |
| Outros Autores: | Vieira, Manuela; Fantoni, Alessandro |
| Assunto: | Thin film Refractive index and thickness determination method Optical setup Prism coupling |
| Ano: | 2020 |
| País: | Portugal |
| Tipo de documento: | capítulo de livro |
| Tipo de acesso: | acesso aberto |
| Instituição associada: | Universidade Politécnica de Lisboa |
| Idioma: | inglês |
| Origem: | Repositório Científico da Universidade Politécnica de Lisboa |
| Resumo: | Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized in the development of integrated circuitry, are applied to both optical circuits and devices. This provides systems that show improved characteristics when compared to their electronic counterparts. Optical systems enable wider bandwidth operation, less power consumption, more immunity to interference and higher cost-efficiency. These features definitely represent a huge improvement in our daily lives when completely embedded in Information and Communications Technologies, replacing a large percentage of contemporaneous electronic based systems. The building blocks of these optical systems consist on waveguides and structures formed by deposited thin films. Two characteristics of utmost importance for these structures are the height and refractive index of the deposited film. In this work and by using a prism coupler, we will be presenting an optical setup and the experimental method that is used to determine both refractive index and thickness of the wave guiding structure. |
|---|