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Nanofios semicondutores : análise de propriedades elétricas e estruturais por microscopia no modo Kelvin Probe

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Bibliographic Details
Summary:Orientador: Mônica Alonso Cotta
Main Authors:Narvaez Gonzalez, Angela Carolina
Subject:Nanofios Microscopia no modo Kelvin Probe Potencial de superfície Microscopia de força atômica Nanowires Kelvin Probe force microscopy Surface potential Atomic force microscopy
Year:2008
Country:Brazil
Document type:master thesis
Access type:open access
Associated institution:IBICT
Language:Portuguese
Origin:Oasisbr
Description
Summary:Orientador: Mônica Alonso Cotta

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