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Low Energy Nuclear Techniques and Microscopy in Surface Analysis of Materials

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Detalhes bibliográficos
Resumo:This article is about computer simulation for surface analysis through nuclear techniques, which are mainly non-destructive. The energy analysis method, nuclear reactions and elastic scattering are used. Energy spectra are computer simulated and compared to experimental data, giving sample composition and concentration profiles. Successful applications of the method are illustrated by 18O(p,α0)15N and 12C(d,p0)13C reactions and elastic scattering of (4He)+ ions, for three types of samples. SEM microscopy is used as a complementary technique for surface imaging.
Autores principais:Carvalho, José Pacheco de
Outros Autores:Pacheco, Cláudia Ribeiro; Reis, António
Assunto:Surface Analysis Computer Simulation Nuclear Reactions Elastic Scattering Microscopy
Ano:2017
País:Portugal
Tipo de documento:documento de conferência
Tipo de acesso:acesso aberto
Instituição associada:Universidade da Beira Interior
Idioma:inglês
Origem:uBibliorum
Descrição
Resumo:This article is about computer simulation for surface analysis through nuclear techniques, which are mainly non-destructive. The energy analysis method, nuclear reactions and elastic scattering are used. Energy spectra are computer simulated and compared to experimental data, giving sample composition and concentration profiles. Successful applications of the method are illustrated by 18O(p,α0)15N and 12C(d,p0)13C reactions and elastic scattering of (4He)+ ions, for three types of samples. SEM microscopy is used as a complementary technique for surface imaging.

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