Publicação
Characterisation of Ti/Al multilayered structures with slow positron beams applying a simplified positron depth distribution model
| Resumo: | In this work the depth of interfaces in multilayered structures was estimated. The fractions of positron annihilation as function of the implantation energy were estimated from an S-W plot and then converted into a function of the sample depth through the positron implantation profile in the multilayer system computed from a reduced positron profile. The results of this method in Ti/Al samples are comparable to those using the common analysis based on positron diffusion equations. The positron analyses results were compared with SIMS profiles for the same samples. |
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| Autores principais: | Naia, M. Duarte |
| Outros Autores: | Gordo, P. M.; Teodoro, O. M. N. D.; Lima, A. P. de; Moutinho, A. M. C. |
| Assunto: | Interfaces Multilayer SIMS Slow positron Thin films General Materials Science Condensed Matter Physics Mechanics of Materials Mechanical Engineering |
| Ano: | 2010 |
| País: | Portugal |
| Tipo de documento: | documento de conferência |
| Tipo de acesso: | acesso aberto |
| Instituição associada: | Universidade Nova de Lisboa |
| Idioma: | inglês |
| Origem: | Repositório Institucional da UNL |
| Resumo: | In this work the depth of interfaces in multilayered structures was estimated. The fractions of positron annihilation as function of the implantation energy were estimated from an S-W plot and then converted into a function of the sample depth through the positron implantation profile in the multilayer system computed from a reduced positron profile. The results of this method in Ti/Al samples are comparable to those using the common analysis based on positron diffusion equations. The positron analyses results were compared with SIMS profiles for the same samples. |
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