Citação norma APA

Cerqueira, M. F., Ferreira, J. A., & Adriaenssens, G. J. (2000). Structural studies and influence of the structure on the electrical and optical properties of microcrystalline silicon thin films produced by RF sputtering.

Citação norma Chicago

Cerqueira, M. F., J. A. Ferreira, and G. J. Adriaenssens. Structural Studies and Influence of the Structure on the Electrical and Optical Properties of Microcrystalline Silicon Thin Films Produced by RF Sputtering. 2000.

Citação norma MLA

Cerqueira, M. F., et al. Structural Studies and Influence of the Structure on the Electrical and Optical Properties of Microcrystalline Silicon Thin Films Produced by RF Sputtering. 2000.

Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.