Publicação
Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films
| Resumo: | Nanocrystalline silicon thin films doped with erbium were produced by reactive magnetron RF sputtering. Their structural and chemical properties were studied by X-ray diffractometry at grazing incidence, micro-Raman, spectroscopic ellipsometry and Rutherford Backscattering Spectroscopy, respectively. Films with different crystalline fraction and crystallite size were deposited. Since the luminescence efficiency of Er-doped nc-Si films is strongly influenced by the microstructure and impurity content (i.e. H, O, Er), the photoluminescence characteristics are discussed in terms of the microstructure. The novelty of these films, if compared to usually investigated structures with the nanocrystals embedded in SiO2, is their relative high conductivity, which makes them attractive for device applications. |
|---|---|
| Autores principais: | Cerqueira, M. F. |
| Outros Autores: | Stepikhova, M.; Losurdo, M.; Giangregorio, M. M.; Alves, E.; Monteiro, T.; Soares, Manuel J.; Boemare, C. |
| Assunto: | Photoluminescence Erbium Nanocrystalline silicon Ellipsometry X-ray diffractometry spectroscopic ellipsometry |
| Ano: | 2003 |
| País: | Portugal |
| Tipo de documento: | artigo |
| Tipo de acesso: | acesso aberto |
| Instituição associada: | Universidade do Minho |
| Idioma: | inglês |
| Origem: | RepositóriUM - Universidade do Minho |
| _version_ | 1877776500639399936 |
|---|---|
| author | Cerqueira, M. F. |
| author2 | Stepikhova, M. Losurdo, M. Giangregorio, M. M. Alves, E. Monteiro, T. Soares, Manuel J. Boemare, C. |
| author2_role | author author author author author author author |
| author_facet | Cerqueira, M. F. Stepikhova, M. Losurdo, M. Giangregorio, M. M. Alves, E. Monteiro, T. Soares, Manuel J. Boemare, C. |
| author_role | author |
| contributor_name_str_mv | RepositóriUM - Universidade do Minho |
| country_str | PT |
| creators_json_txt | [{\"Person.name\":\"Cerqueira, M. F.\"},{\"Person.name\":\"Stepikhova, M.\"},{\"Person.name\":\"Losurdo, M.\"},{\"Person.name\":\"Giangregorio, M. M.\"},{\"Person.name\":\"Alves, E.\"},{\"Person.name\":\"Monteiro, T.\"},{\"Person.name\":\"Soares, Manuel J.\"},{\"Person.name\":\"Boemare, C.\"}] |
| datacite.contributors.contributor.contributorName.fl_str_mv | RepositóriUM - Universidade do Minho |
| datacite.creators.creator.creatorName.fl_str_mv | Cerqueira, M. F. Stepikhova, M. Losurdo, M. Giangregorio, M. M. Alves, E. Monteiro, T. Soares, Manuel J. Boemare, C. |
| datacite.date.Accepted.fl_str_mv | 2003-01-01T00:00:00Z |
| datacite.rights.fl_str_mv | http://purl.org/coar/access_right/c_abf2 |
| datacite.subjects.subject.fl_str_mv | Photoluminescence Erbium Nanocrystalline silicon Ellipsometry X-ray diffractometry spectroscopic ellipsometry |
| datacite.titles.title.fl_str_mv | Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films |
| dc.contributor.none.fl_str_mv | RepositóriUM - Universidade do Minho |
| dc.creator.none.fl_str_mv | Cerqueira, M. F. Stepikhova, M. Losurdo, M. Giangregorio, M. M. Alves, E. Monteiro, T. Soares, Manuel J. Boemare, C. |
| dc.date.Accepted.fl_str_mv | 2003-01-01T00:00:00Z |
| dc.format.none.fl_str_mv | application/pdf |
| dc.identifier.none.fl_str_mv | https://hdl.handle.net/1822/13958 |
| dc.language.none.fl_str_mv | eng |
| dc.publisher.none.fl_str_mv | Elsevier |
| dc.rights.none.fl_str_mv | http://purl.org/coar/access_right/c_abf2 |
| dc.subject.none.fl_str_mv | Photoluminescence Erbium Nanocrystalline silicon Ellipsometry X-ray diffractometry spectroscopic ellipsometry |
| dc.title.fl_str_mv | Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films |
| dc.type.none.fl_str_mv | http://purl.org/coar/resource_type/c_6501 |
| description | Nanocrystalline silicon thin films doped with erbium were produced by reactive magnetron RF sputtering. Their structural and chemical properties were studied by X-ray diffractometry at grazing incidence, micro-Raman, spectroscopic ellipsometry and Rutherford Backscattering Spectroscopy, respectively. Films with different crystalline fraction and crystallite size were deposited. Since the luminescence efficiency of Er-doped nc-Si films is strongly influenced by the microstructure and impurity content (i.e. H, O, Er), the photoluminescence characteristics are discussed in terms of the microstructure. The novelty of these films, if compared to usually investigated structures with the nanocrystals embedded in SiO2, is their relative high conductivity, which makes them attractive for device applications. |
| dirty | 0 |
| eu_rights_str_mv | openAccess |
| format | article |
| id | rum_0b4cc72178c8efef2bb5d690093531f5 |
| identifier.url.fl_str_mv | https://hdl.handle.net/1822/13958 |
| inst_facet_str | urn:organizationAcronym:repositorium{{{_:::_}}}Universidade do Minho |
| instacron_str | repositorium |
| institution | Universidade do Minho |
| instname_str | Universidade do Minho |
| language | eng |
| network_acronym_str | rum |
| network_name_str | RepositóriUM - Universidade do Minho |
| oai_identifier_str | oai:repositorium.uminho.pt:1822/13958 |
| organization_str_mv | urn:organizationAcronym:repositorium |
| person_str_mv | Cerqueira, M. F. Stepikhova, M. Losurdo, M. Giangregorio, M. M. Alves, E. Monteiro, T. Soares, Manuel J. Boemare, C. |
| publishDate | 2003 |
| publisher.none.fl_str_mv | Elsevier |
| repo_facet_str | urn:repositoryAcronym:rum{{{_:::_}}}RepositóriUM - Universidade do Minho |
| reponame_str | RepositóriUM - Universidade do Minho |
| repository_id_str | urn:repositoryAcronym:rum |
| service_str_mv | urn:repositoryAcronym:rum |
| spelling | engElsevierporNanocrystalline silicon thin films doped with erbium were produced by reactive magnetron RF sputtering. Their structural and chemical properties were studied by X-ray diffractometry at grazing incidence, micro-Raman, spectroscopic ellipsometry and Rutherford Backscattering Spectroscopy, respectively. Films with different crystalline fraction and crystallite size were deposited. Since the luminescence efficiency of Er-doped nc-Si films is strongly influenced by the microstructure and impurity content (i.e. H, O, Er), the photoluminescence characteristics are discussed in terms of the microstructure. The novelty of these films, if compared to usually investigated structures with the nanocrystals embedded in SiO2, is their relative high conductivity, which makes them attractive for device applications.application/pdfporInfluence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin filmsCerqueira, M. F.Stepikhova, M.Losurdo, M.Giangregorio, M. M.Alves, E.Monteiro, T.Soares, Manuel J.Boemare, C.HostingInstitutionOrganizationalRepositóriUM - Universidade do Minhoe-mailmailto:repositorium@usdb.uminho.ptrepositorium@usdb.uminho.ptISSNIsPartOf0026-2692DOIIsPartOf10.1016/S0026-2692(03)00028-420032003-01-01T00:00:00ZHandlehttps://hdl.handle.net/1822/13958http://purl.org/coar/access_right/c_abf2open accessPhotoluminescenceErbiumNanocrystalline siliconEllipsometryX-ray diffractometryspectroscopic ellipsometry278243 bytesliteraturehttp://purl.org/coar/resource_type/c_6501journal articlehttp://purl.org/coar/access_right/c_abf2application/pdfhttps://repositorium.uminho.pt/bitstreams/20261534-be82-405c-b121-87c3ad639334/download |
| spellingShingle | Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films Cerqueira, M. F. Photoluminescence Erbium Nanocrystalline silicon Ellipsometry X-ray diffractometry spectroscopic ellipsometry |
| status | SINGLETON |
| subject.fl_str_mv | Photoluminescence Erbium Nanocrystalline silicon Ellipsometry X-ray diffractometry spectroscopic ellipsometry |
| title | Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films |
| title_full | Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films |
| title_fullStr | Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films |
| title_full_unstemmed | Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films |
| title_short | Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films |
| title_sort | Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films |
| topic | Photoluminescence Erbium Nanocrystalline silicon Ellipsometry X-ray diffractometry spectroscopic ellipsometry |
| topic_facet | Photoluminescence Erbium Nanocrystalline silicon Ellipsometry X-ray diffractometry spectroscopic ellipsometry |
| url | https://hdl.handle.net/1822/13958 |
| visible | 1 |
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