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a-SiH p-i-n structures with extreme i-layer thickness

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Resumo:We present measurements and numerical simulation of a-Si:H p-i-n detectors with a wide range of intrinsic layer thickness between 2 and 10 pm. Such a large active layer thickness is required in applications like elementary particle detectors or X-ray detectors. For large thickness and depending on the applied bias, we observe a sharp peak in the spectral response in the red region near 700 nm. Simulation results obtained with the program ASCA are in agreement with the measurement and permit the explanation of the experimental data. In thick samples holes recombine or are trapped before reaching the contacts, and the conduction mechanism is fully electron dominated. As a consequence, the peak position in the spectral response is located near the optical band gap of the a-Si:H i-layer. (C) 2009 Elsevier B.V. All rights reserved.
Autores principais:Fantoni, Alessandro
Outros Autores:Fernandes, Miguel; Vieira, Manuela; Casteleiro, C.; Schwarz, R.
Assunto:Amorphous materials Sensors Electrical properties and measurements Photoconductivity Numerical simulation
Ano:2009
País:Portugal
Tipo de documento:documento de conferência
Tipo de acesso:acesso restrito
Instituição associada:Universidade Politécnica de Lisboa
Idioma:inglês
Origem:Repositório Científico da Universidade Politécnica de Lisboa

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